What is record-level survivorship rule in SAP EIM-MDS - SAP Master Data Services?

SAP Term: record-level survivorship rule

• Component: EIM-MDS

• Component Name: SAP Master Data Services

• Description: A mandatory set of comparative criteria used to evaluate records in a source record cluster in order to define which source record in the source record cluster is the default record.

Smart SAP Assistant

• Key Concepts: 
  Record-level survivorship rule is a feature of SAP Master Data Services (EIM-MDS) that allows users to define a set of rules to determine which records should be kept and which should be discarded when merging duplicate records. The rule is based on the values of the attributes in the records, and it can be used to ensure that only the most accurate and up-to-date records are kept.
  
  How to use it: 
  To use the record-level survivorship rule, users must first define a set of rules that will determine which records should be kept and which should be discarded. This can be done by selecting the attributes that should be used for comparison, as well as setting the criteria for determining which record should be kept. Once the rules have been defined, they can then be applied to any duplicate records that are found in the system.
  
  Tips & Tricks: 
  When defining the rules for record-level survivorship, it is important to consider all of the attributes that may affect the accuracy of the data. For example, if a record contains an outdated address, it may be better to keep the record with the most up-to-date address instead of discarding both records. Additionally, it is important to consider how different attributes may interact with each other when determining which record should be kept. 
  
  Related Information: 
  The record-level survivorship rule is just one of many features available in SAP Master Data Services (EIM-MDS). Other features include data cleansing, data enrichment, and data validation. Additionally, EIM-MDS also provides tools for managing master data across multiple systems and applications.