How To Fix RAP_BO_CTR_TEST_DEMO003 - ACTION_DUPL_EXISTING_KEY test failed for '&1'


SAP Error Message - Details

  • Message type: E = Error

  • Message class: RAP_BO_CTR_TEST_DEMO - Demo Message class for RAP BO Contract tests

  • Message number: 003

  • Message text: ACTION_DUPL_EXISTING_KEY test failed for '&1'

  • Show details Hide details
  • What causes this issue?

    The test executes an action on &V1& for multiple instances with same
    existing key.
    One of the following could be the reason for the failure of the test:
    a) Action key not listed in 'RESULT'.
    b) Instances found in 'FAILED'.
    c) If there are keys listed in failed for these keys there is no error
    message.

    System Response

    The system issues an error message and will not allow you to continue with this transaction until the error is resolved.

    How to fix this error?

    Procedure for System Administrators


    Error message extract from SAP system. Copyright SAP SE.


Smart SAP Assistant

  • What is the cause and solution for SAP error message RAP_BO_CTR_TEST_DEMO003 - ACTION_DUPL_EXISTING_KEY test failed for '&1' ?
    The SAP error message RAP_BO_CTR_TEST_DEMO003 ACTION_DUPL_EXISTING_KEY test failed for '&1' typically occurs in the context of the SAP RAP (Rapid Application Programming) model, particularly when dealing with business object actions that involve creating or updating records. This error indicates that there is an attempt to create or update a record with a key that already exists in the database, which violates the uniqueness constraint.
    
    Cause: Duplicate Key Violation: The most common cause of this error is that the action being performed (like creating a new record) is trying to insert a record with a key that already exists in the database. This could happen if: The key value being used is not unique. There is a logic error in the application that generates or assigns keys. The data being sent to the action is incorrect or not validated properly. Test Data Issues: If this error occurs during testing, it may be due to the test data

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